Project Description
LEGAL Materials laboratory needed for measuring surface of a flexible thin film material to characterize a few topographical features such as surface roughness Ra.
Contact mode AFM testing in ambient;
non-contact optical interferometric profilometer such as Wyko profilometer.
Capable to scan 200x200 um area of sample, with resolution down to 0.5 nm roughness for smoothest materials.
Project Information
Number:16-01310
Industry:Advanced Materials
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