Electrical Characterization Testing
Project Description
MULTIPLE TESTING
USA Electrical laboratory needed for electrical characterization on GaN high electron mobility transistor (HEMT) devices on a wafer. i am interested in doing Current collapse and pulsed IV tests on HEMT devices. i also want to know if you can do- Dissipation Factor characterization of dielectric materials in a microstrip line (10GHz).
Project Information
Number:23-00105