Weschler Analytics is a provider of microscopy related analytical services. The lab can provide Scanning Electron Microscope (SEM) investigations including secondary electron and backscatter electron (SE and BSE) imaging in both high and low vacuum modes. Energy Dispersive Spectroscopy (EDS) is also possible to determine elemental composition. Sample coating with gold or carbon is available. Weschler Analytics also has access to Focused Ion Beam (FIB) and Dual Beam FIB-SEM technology to provide subsurface and cross sectional investigations at the nanoscale. Numerous other analytical techniques are available upon request (including TEM, electrical probing, nano-probing and more) the lab strives to be able to solve any customer problem selecting the correct technique to get the data required.
Matt Weschler has been working in the microscopy industry for over 20 years. His focus has been the usage and applications of SEM, FIB, and Dual Beam FIB-SEM. Matt has supported customers using these nanoscale imaging techniques in all industries including semiconductor, pharmaceutical, and biology. The lab understands the need for accurate results in a timely manner, with a solid sample report delivered to the customer in a professional and understandable way.