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IEC 60749 - Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
ASTM D5127-13(2018): - Standard Guide for Ultra-Pure Water Used in the Electronics and Semiconductor Industries
ASTM E431 - Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
ASTM F1893 - Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
ASTM F1467 - Standard Guide for Use of an X-Ray Tester (~10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM E431 - Standard Active Last Updated: Oct 12, 2022 Track Quick Add E431-96(2022) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
ASTM 1161 - Standard Practice for Radiographic Examination of Semiconductors and Electronic Components
ASTM F76 - Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
ASTM F72 - Standard Specification for Gold Wire for Semiconductor Lead Bonding
ASTM F980 - Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
ASTM F487 - Standard Specification for Fine Aluminum-1?% Silicon Wire for Semiconductor Lead-Bonding
ASTM F1892 - Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
ASTM F1192 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
ASTM D5127 - Standard Guide for Ultra-Pure Water Used in the Electronics and Semiconductor Industries
ASTM 7980 - Standard Guide for Ion-Chromatographic Analysis of Anions in Grab Samples of Ultrapure Water (UPW) in the Semiconductor Industry
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