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Weschler Analytics LLC
1871 Napoli Drive
Apex, NC 27502 US
Focused Ion Beam (FIB) and Dual Beam FIB-SEM technology to provide subsurface and cross sectional investigations at the nanoscale.
Scanning Electron Microscope (SEM) investigations including secondary electron and backscatter electron (SE and BSE) imaging in both high and low vacuum modes.