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Evans Analytical offers Materials Testing, Materials Characterization, Auger Electron Spectroscopy (AES, Auger) Analysis, Atomic Force Microscopy (AFM Analysis), Electron Backscatter Diffraction (EBSD) , Energy Dispersive X-ray Spectroscopy (EDS, Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM). Energy Dispersive x-Ray Spectroscopy, Fourier Transform Infrared Spectroscopy (FTIR) analysis, Gas Chromatography Mass Spectrometry, GC-MS Analysis, Glow Discharge Mass Spectrometry (GDMS), Inductively Coupled Plasma Spectroscopy (ICP-OES/MS), ICP Analysis, Instrumental gas analysis (IGA), Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS), Low Energy X-ray Emission Spectrometry (LEXES), Optical profilometry (OP), Raman Spectroscopy (Raman Analysis), Rutherford Backscattering Spectrometry, RBS Analysis, Scanning Electron Microscopy, SEM Analysis, Secondary Ion Mass Spectrometry (SIMS) , Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM), Thermal Analysis, Time-of-Flight Secondary Ion Mass Spectrometry, TOF-SIMS Analysis, Surface Microanalysis, Organic Analysis, Inorganic Analysis, Total Reflections X-ray Fluorescence (TXRF), X-Ray Photoelectron Spectroscopy / Electron Spectroscopy for Chemical Analysis (XPS / ESCA), X-ray Diffraction (XRD) Analysis, Aerospace/Defense Testing, Automotive Testing, Chemicals & Polymers Testing, Electronics Testing, Energy Testing, Lighting Testing, Medical Device Testing, Metals Testing, Alloy Testing, Pharmaceutical Testing, Solar Energy Testing, Semiconductor Testing, Telecommunications Testing
2672 Metro Blvd.
Maryland Heights, MO 63043