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We use the suite of Auger, XPS (or ESCA), and SIMS to analyze the outer atomic layer of materials to characterize surface chemistry. Sputter depth profiles are used to characterize the composition vs. depth of materials and are especially useful in determining passivation layers on stainless steel or surface oxide differences between samples.
Take a Laboratory Tour of Rocky Mountain Laboratories, Inc.
602 Park Point Drive
Golden, Colorado 80401 US